Anchor is a pioneer and a worldwide leader in semiconductor hotspot pattern management and analysis software, supplying both foundries and IDMs with a suite of software solutions to improve manufacturing efficiency and chip yield. Under the innovative pattern-centric Yield Accelerator (YA) platform, Anchor helps with resolving the rapidly increasing challenges of analyzing and managing significant volumes of CD metrology data from the fab, determining process critical design patterns, and optimizing fab processes.

The advanced Yield Accelerator (YA) family of products integrates comprehensive layout analysis with advanced technologies that provide production-validated and design-based solutions for 14nm technology nodes and beyond.

The extended application areas include layout-related hotspot identification and analysis, OPC verification, photomask manufacturing, wafer-level printing, and yield enhancement.

Through joint effort with our customers, our patented technology brings design knowledge into the manufacturing process flow while helping customers achieve successes in shortened time-to-yield and time-to-profitability.